Stand: 21.6.2021, 15:37
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Stand: 21.6.2021, 15:37
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Vol |
Jahr |
No. |
Seiten |
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|---|---|---|---|---|---|---|---|---|---|---|
| S. Getlawi | M. Theis, S. Friedrich, A. Koblischka-Veneva, M. R. Koblischka, M. Saumer, U. Hartmann | „Characterization of Electroplated, Thick Permalloy Films“ | Physica Status Solidi A | 205 | 2008 | 255 | DOI: 10.1002/pssa.200723621; presented at the 3rd Seeheim conference on magnetism, Frankfurt, Germany, 26.8.-30.8.2007 | PDF verfügbar | published |
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| M. R. Koblischka | M. Kirsch, M. Brust, A. Koblischka-Veneva, U. Hartmann | „Preparation of Thin Ferrite Films on Silicon Substrates“ | Physica Status Solidi A | 205 | 2008 | 1783-1786 | presented at the 3rd Seeheim conference on magnetism, Frankfurt, Germany, 26.8.-30.8.2007 | published |
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| A. Koblischka-Veneva | F. Mücklich, M. R. Koblischka, U. Hartmann, S. Murphy, I. V. Shvets | „Study of Cross-sections of Magnetite Thin Films by Means of Electron-backscatter Diffraction“ | Physica Status Solidi A | 205 | 2008 | 1835-1838 | DOI: 10.1002/pssa.200723634; presented at the 3rd Seeheim conference on magnetism, Frankfurt, Germany, 26.8.-30.8.2007 | PDF verfügbar | published |
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| Y. Hao | F. Mücklich, G. Petzow | „Correlation between Scattering Behaviour of H.C.P. Single Crystals and Incorporated Dislocation Arrangement Quantified by the Fourier Transformation“ | Physica Status Solidi A | 158 | 1996 | 9 | 9-17 | published |
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| F. Mücklich | H. Oettel | „Measurement of Harmonic Reflections - An X-ray Method for Real Structure Analysis of Semiconducting Compounds“ | Physica Status Solidi A | 129 | 1992 | 323-335 | published |
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